Leading HDD Manufacturer Adopts Jordan Valley's JVX7300RF (XRR&XRF) Platform for Metrology of Advanced Magnetic Heads

Jordan Valley, the dominant supplier of X-ray based in-line metrology systems for the semiconductor and related industries, today announced it received a repeat order from a leading HDD manufacturer who selected the new JVX7300RF metrology system for their advanced process control. The JVX7300RF system provides high-value in-line metrology capabilities and combines Jordan Valley's unique convergentbeam XRR and the vertical small spot XRF measurement channels on their latest generation tool platform. The tool provides product wafers metrology solutions for complex multilayer stacks, ultra-thin layers (<10Å) and small pads. The JVX7300RF provides excellent ROI and CoO for inline metrology of magnetic stacks used in latest generation of read-heads and allows non-destructive thickness and composition measurements at high throughputs prior to head assembly. The customer noted that the JVX7300RF was ordered after successful evaluation of the combined XRR/XRF technology in multiple production sites last year. Isaac Mazor, Jordan Valley's CEO commented: "This tool was selected due to its substantial return of investment. Hard disk manufacturers set unique metrology challenges and requirements for advanced process control. The JVX7300RF is the successor of the production proven JVX6200iRF and provides significantly improved productivity, new capabilities, improved ease-of-use, maintainability and more."