Aehr Test Systems to Present at LD Micro Invitational Conference on June 8, 2022

FREMONT, Calif., June 03, 2022 (GLOBE NEWSWIRE) -- Aehr Test Systems AEHR, a worldwide supplier of semiconductor test and reliability qualification equipment, today announced that CEO and President Gayn Erickson will be presenting at the LD Micro 12^th Annual Invitational Conference on Wednesday, June 8^th at 12:00pm PT at the Four Seasons Hotel in Westlake Village, CA, and will be meeting with investors throughout the day. You may register to watch the presentation here.

"We look forward to discussing our semiconductor wafer level and singulated die test and burn-in solutions and the markets they serve with investors," said Mr. Erickson. "Aehr Test provides complete production solutions for improving yield and reliability of semiconductors, and devices such as silicon carbide semiconductors used in electric and hybrid electric vehicles, silicon photonics devices used in data centers and 5G infrastructure, and 2D/3D and other sensors used in mobile and wearable applications, which are expected to be significant revenue drivers for our products this fiscal year and next."

"We are honored to be hosting our 12th annual installment of the Invitational at the Four Seasons," said Chris Lahiji, founder of LD Micro. "Aehr Test Systems has always been a standout at our events, and we are proud to have them back."

About LD Micro
LD Micro aims to be the most crucial resource in the micro-cap world. Whether it is the index, comprehensive data, or hosting the most significant events on an annual basis, LD's sole mission is to serve as an invaluable asset for all those interested in finding the next generation of great companies http://www.ldmicro.com.

About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic, optical and memory integrated circuits and has installed over 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, incremental capacity needs, and new opportunities for Aehr Test products in package, wafer level, and singulated die/module level test. Aehr Test has developed and introduced several innovative products, including the ABTS™ and FOX-P™ families of test and burn-in systems and FOX WaferPak™ Aligner, FOX-XP WaferPak Contactor, FOX DiePak^® Carrier and FOX DiePak Loader. The ABTS system is used in production and qualification testing of packaged parts for both lower power and higher power logic devices as well as all common types of memory devices. The FOX-XP and FOX-NP systems are full wafer contact and singulated die/module test and burn-in systems used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers, systems-on-a-chip, and integrated optical devices. The FOX-CP system is a new low-cost single-wafer compact test and reliability verification solution for logic, memory and photonic devices and the newest addition to the FOX-P product family. The WaferPak Contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. The DiePak Carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of both bare die and modules. For more information, please visit Aehr Test Systems' website at www.aehr.com.