From Earlier: Nova Receives Multiple Orders for its V2600 Through Silicon Via Metrology System

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Nova Measuring Instruments Ltd.
NVMI
, a leading provider of optical metrology solutions to the semiconductor process control market, reported today that two major customers ordered its recently launched TSV (Through-Silicon Via) metrology system, the Nova V2600^[^TM^]. These orders follow a thorough technical evaluation process by customer experts selecting the Nova V2600 for its unique ability to provide complete three-dimensional metrology of the TSV for several technology nodes. Profile information, available for the first time through the use of Nova's patent pending Dark-Field Reflectometry, is considered critical for properly controlling the etching and insulation steps of TSV formation. The high-throughput Nova V2600 was selected to support the transition to volume production of 3D integration with minimal yield loss to TSV electrical failures.
Posted In: NewsFDA
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