KLA-Tencor Corp was formed in April 1997. It is a supplier of process control and yield management solutions for the semiconductor and related nanoelectronics industries. Its products are also used in other high technology industries, including the light emitting diode and data storage industries, as well as general materials research. Its portfolio of defect inspection and metrology products, and related service, software and other offerings, helps integrated circuit manufacturers manage yield throughout the entire semiconductor fabrication process—from research and development to final volume production. Its products and services are used by the bare wafer, IC, lithography reticle and disk manufacturers. The Company provides inline wafer and IC defect monitoring, review and classification; reticle defect inspection and metrology; packaging and interconnect inspection; critical dimensionmetrology; pattern overlay metrology; film thickness, surface topography and composition measurements; measurement of in-chamber process conditions, wafer shape and stress metrology; computational lithography tools; and overall yield and fab-wide data management and analysis systems.