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Smart Tweezers LCR-meter Distribution in Japan is Supported by Van Device from Tokyo, Japan

Canadian Siborg Systems Inc and Van Device Ltd from Tokyo, Japan sign an agreement for distribution of Smart Tweezers LCR-meter in Asia.

Tokyo, Japan (PRWEB) November 27, 2012

Ontario, Canada based Siborg Systems Inc and Van Device Ltd from Tokyo, Japan agreed for distribution of Smart Tweezers LCR-meter in Asia. This is the second agreement signed by Siborg Systems in Japan in attempt to expand its presence in Asia and Japan in particular.

Van Device Ltd is a recognized distributor of microchips, electronic components, computer parts and peripherals. It primarily offers imported products to Japanese clients. The company also offers unique test equipment for for PCBs, fiber optics and computer networks.

"By the nature of our business we are in direct contact with many Printed Circuit Board (PCB) manufacturers and designers of new electronic products," says Yoshitaka Sato, Director at Van Device Ltd, "They all value Smart Tweezers, the ultimate LCR-meter for Surface Mount Technology (SMT). Light-weight, ease-of-use and accuracy make Smart Tweezers LCR-meter and indespensible tool for PCB debugging and testing as well as component characterization."

Smart Tweezers from Siborg Systems Inc. is simply a highly accurate LCR meter designed specifically for electronic testing in Surface Mount Technology with a pair of tweezers acting as the probes. The newest model offers component sorting, continuity and diode testing, designated ESR measurements and an estimated 6 times higher basic accuracy of 0.2% well above older models.

Unlike more expensive bench-type testers that offer the same high accuracy as Smart Tweezers and take time setting up for accurate measurements. Smart Tweezers LCR-meter are a simple solution for efficiency. The integration of tweezers as probes, an LCD screen in the handle, and an LCR meter in a pen-sized unit allows for comfortable, one handed tool, allowing the other hand to be free for taking notes or holding other tools. Smart Tweezers make short work of testing or debugging PCBs or testing and troubleshooting components.

Able to automatically determine the type of component with an SMD component identification, Smart Tweezers measures Inductance (L), Capacitance (C) or Resistance (R) of all types of passive or through-hole devices. With the same high speed and accuracy, Smart Tweezers doubles as an ESR meter able to measure secondary parameters, i.e. the Equivalent Series Resistance (ESR) of a capacitor.

With a patented mechatronic design, Smart Tweezers LCR-meter features very low and well defined parasitics that are easily eliminated using a new semi-automatic offset subtraction feature that allows the device to measure very small resistance and capacitance of 1 milliohms and 1 picofarad range. Unlike other similar devices that only offer resistance and capacitance measurements, Smart Tweezers boast inductance measurements of a fraction of microhenry, essential when working with radio electronics.

Smart Tweezers are the utmost essential tool for professional use in the electronics industry, as proven by most high-tech companies worldwide, it has been proven indispensable for in-circuit and on-board impedance testing, SMD component sorting and PCB debugging.

All the latest new is available on the Smart Tweezers Blog

About Siborg Systems Inc:
Established in 1994, Siborg Systems Inc. is a source of engineering software and hardware tools for semiconductor and electronics industry. Located in the city of Waterloo, Ontario, Canada, it enjoys being part of the local world-renowned high-tech community.

About Van Device, Ltd:
Established in 1999, the company offers microchips, electronic components, computer parts and peripherals. The company also offers unique PCB test and inspection somultions.

For more info please contact:
Van Device Ltd.,
9-10-202 Nihonbashi Kobunacho
Chuo-ku TOKYO, 103-0024 JAPAN
Tel +81-3-5652-2888
Fax +81-3-5652-2889
Contact:Fumio Iwamoto
iwa (at) vandevice (dot) co (dot) jp

For the original version on PRWeb visit: http://www.prweb.com/releases/prweb2012/11/prweb10168786.htm

 

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